CooperationCooperation with the IFUMEquipment
X-ray diffractometer XSTRESS X3000 G2

X-ray diffractometer XSTRESS X3000 G2

A non-destructive measurement of residual stresses is possible using X-ray diffraction. This involves evaluating the reflection of X-rays on the atomic lattice planes of crystalline materials. The measurement is carried out according to the Bragg principle. This enables a comparison between the grid plane spacing d0 in the unloaded state and the grid plane spacing d in the loaded state. Based on the difference of the net plane distance, a calculation of the residual stress is possible. At the Institute of Forming Technology and Forming Machines, this method of residual stress measurement is applied with the help of the X-ray diffractometer XSTRESS X3000 G2 from Stresstech. Furthermore, a determination of retained austenite is possible with this device for ferritic microstructures.

Feasible experiments and experimental parameters:

  • Residual stress measurement (surface and depth profile)
  • Determination of the retained austenite content in ferritic structures

Technical data:

  • X-ray tube operating values: 30 kV, 8 mA
  • Tube output: 200 - 300 W
  • Maximum component size: theoretically unlimited
  • 4-point bending device for the determination of the radiographic elasticity constants
  • Different materials can be analysed using chrome, copper and titanium tubes
  • Automatic mapping measurements are possible via programming of the X-Y table
  • Precise movement through computer-controlled DC servo motor drives
  • XTRONIC measurement and evaluation software with a large material database

CONTACT

Hendrik Wester, M. Sc.
Division Manager
Address
An der Universität 2
30823 Garbsen
Hendrik Wester, M. Sc.
Division Manager
Address
An der Universität 2
30823 Garbsen