Fracture resistance evaluation of RuO2-based thick film resistor material by in situ crack extension observation in a scanning electron microscope, ISSN 1359-6454, Acta Materialia, Volume 56, Issue 18, October 2008, pp. 5027-5033
| Kategorien |
Zeitschriften/Aufsätze (reviewed) |
| Jahr | 2008 |
| Autorinnen/Autoren | Dorsch, N. S.; Peshekhodov, I.; Spies, P.; Schneider, G. A. |
